Deep Learning-Based Self-Admitted Technical Debt Detection Empirical Research,ERICDATA高等教育知識庫
高等教育出版
熱門: Qiaoyun Zhang  Scopus AI  Helong Xia  美国 通识教育计划  Semi-trusted loader  Zhi-Wei Sun  
高等教育出版
首頁 臺灣期刊 學校系所 學協會 民間出版 大陸/海外期刊 政府機關 學校系所 學協會 民間出版 DOI查詢服務 DOI註冊服務
篇名
Deep Learning-Based Self-Admitted Technical Debt Detection Empirical Research
並列篇名
Deep Learning-Based Self-Admitted Technical Debt Detection Empirical Research
作者 Yubin Qu、Tie Bao、Meng Yuan、Long Li
英文摘要

Self-Admitted Technical Debt (SATD) is a workaround for current gains and subsequent software quality in software comments. Some studies have been conducted using NLP-based techniques or CNN-based classifiers. However, there exists a class imbalance problem in different software projects since the software code comments with SATD features are significantly less than those without Non-SATD. Therefore, to design a classification model with the ability of dealing with this class imbalance problem is necessary for SATD detection. We propose an improved loss function based on information entropy. Our proposed function is studied in a variety of application scenarios. Empirical research on 10 JAVA software projects is conducted to show the competitiveness of our new approach. We find our proposed approach can perform significantly better than state-of-the-art baselines.

 

起訖頁 975-987
關鍵詞 Deep learning、Convolutional neural network、Long short-term memory、Loss function、Class imbalance
刊名 網際網路技術學刊  
期數 202307 (24:4期)
出版單位 台灣學術網路管理委員會
DOI 10.53106/160792642023072404015   複製DOI
QR Code
該期刊
上一篇
G-DCS: GCN-Based Deep Code Summary Generation Model
該期刊
下一篇
Avoiding Optimal Mean Robust and Sparse BPCA with L1-norm Maximization

高等教育知識庫  新書優惠  教育研究月刊  Ericdata高等教育知識庫