A new algorithm for high-frequency capacitance performance parameter testing based on multiple ways of errors eliminate

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篇名	A new algorithm for high-frequency capacitance performance parameter testing based on multiple ways of errors eliminate
並列篇名	A new algorithm for high-frequency capacitance performance parameter testing based on multiple ways of errors eliminate
作者	Pei-Zhong Liu、Ming Hong、Hong-Xiang Wang、Ming-Hang Wang
起訖頁	027-034
關鍵詞	capacitance parameter、de-embeding、high-frequency capacitors、polynomial fitting、vector network analyzers、capacitance parameter、de-embeding、high-frequency capacitors、polynomial fitting、vector network analyzers
刊名	電腦學刊
期數	201706 (28:3期)
DOI	10.3966/199115592017062803003 複製DOI
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